Jefferson Lab Fast Ion Chambers


D. Dotson, K. L. Mahoney


Fast ion chambers designed specifically for radiation protection have been in use at the Jefferson Lab for over 5 years. In the ensuing time, the chambers have become the instrumentation of choice for traceable high reliability, high radiation beam loss measurements. The chambers, which feature a 6 decade calibrated range, include an integrated adjustable high voltage power supply, analog output, contact/fiber optic fault outputs, as well as built-in self test functions. This paper describes the construction of the Jefferson Lab fast ion chambers and presents field data for several of the applications for which the chambers are used.


This abstract was presented at the 33rd Annual Midyear Meeting, "Instrumentation, Measurements, and Electronic Dosimetry", Abstracts Session, 1/30/2000 - 2/2/2000, held in Virginia Beach, VA.

Index of Midyear Meeting Abstracts