The Center for Advanced Microstructures and Devices (CAMD) is pleased to host the 2005 Synchrotron Radiation Instrumentation (SRI) Conference. Perhaps we could put together a poster session on radiation protection for synchrotron rings. I know we have the biannual International Radiation Protection at Synchrotron Facilities (last held in Japan), but this might be another opportunity to get together.
Please note that the deadline for abstract submission is very soon--July 1--but it is not impossible to write an abstract in 30 minutes. Hope that at least some of you will consider submitting a poster. Further information is provided below.
The deadline for abstract submission, July 1, for the US Synchrotron Radiation Instrumentation (SRI 2005) Conference at Baton Rouge, Louisiana (September 21-23, 2005) is approaching. Please visit the SRI-2005 website to submit an abstract and register for the conference. We hope to see you in Baton Rouge next September.
The most recent comprehensive workshop in the U.S. on synchrotron radiation (SR) detectors occurred a half decade ago. The consensus of the last U.S. workshop was that a clear gulf existed between the capabilities of modern synchrotrons to deliver high photon fluxes and the capabilities of detectors to measure the resulting photon, electron, or ion signals. During the last half decade, the world community, and especially the European community, has aggressively pursued detector research as a mechanism to enhance synchrotron capabilities and enable new research opportunities.
Objectives:
The proposal for the workshop will be submitted to the National Science Foundation (NSF) in the near future. Several international speakers are planned to be invited to the workshop.
The assessment and optimization of electron beam size in synchrotron light sources continues to be highly relevant to the successful exploitation of the source. As sources of higher brightness have been developed, the accurate measurements of the source electron beam size, particularly in the vertical direction, has provided essential input to the optimization. The limitations of optical-based techniques have been used: pinhole optics, fresnel-based systems, interferometry, etc. Such techniques have much common ground between the accelerator and synchrotron light instrumentation communities.
Objectives:
SRI 2005 conference will feature oral and poster sessions on synchrotron-related topics, workshops, a tour of CAMD synchrotron facility, and a Cajun-style banquet at a Louisiana-style plantation. Vendor exhibits are scheduled on Wednesday and Thursday. For the full schedule, please visit the website.